Siglent SNA5000-MT Material measurement license option
The SNA5000-MT option adds Material Measurement capability to SIGLENT SNA5000A Series Vector Network Analyzers. It enables accurate characterization of dielectric properties such as permittivity, permeability, and loss tangent of RF and microwave materials.
SIGLENT SNA5000-MT Material Measurement Option
The SNA5000-MT option enables advanced Material Measurement capabilities on SIGLENT SNA5000A Series Vector Network Analyzers. This option allows precise characterization of dielectric properties such as permittivity, permeability, and loss tangent of solid, liquid, and sheet materials across a wide frequency range.
By integrating material measurement directly into the SNA5000A platform, engineers and researchers can evaluate RF and microwave material properties without dedicated material analyzers, making it ideal for laboratories, universities, and industrial R&D environments.
Key Features & Benefits
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Electromagnetic material characterization
Measure complex permittivity and permeability with high accuracy. -
Wide range of material types
Suitable for solids, liquids, thin sheets, and dielectric substrates. -
Multiple measurement models
Supports transmission/reflection and waveguide-based measurement methods. -
Frequency-dependent material analysis
Evaluate material behavior across the operating frequency range. -
Integrated VNA workflow
Uses existing S-parameter calibration, markers, and data analysis tools. -
Software license option
Activated via license key — no additional hardware required.
Ideal Applications
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RF and microwave material research
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PCB substrate and laminate characterization
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Dielectric and absorber testing
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Academic and industrial R&D
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Quality control and material comparison
Compatibility
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Compatible with SIGLENT SNA5000A Series Vector Network Analyzers
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License-based option, activated directly on the instrument
Why Choose the SNA5000-MT Option?
The SNA5000-MT option transforms the SNA5000A into a powerful material characterization system, providing accurate electromagnetic material data without additional instrumentation. It is an essential upgrade for engineers and researchers working with RF, microwave, and high-frequency materials.