The SNA5000-TDA option adds Time Domain Analysis (TDA) capability to SIGLENT SNA5000A Series Vector Network Analyzers. It converts frequency-domain S-parameter data into the time domain, enabling clear visualization of reflections, impedance changes, and discontinuities in RF structures, cables, and interconnects.

The SNA5000-TDR option adds advanced Time Domain Reflectometry (TDR/TDT) capability to SIGLENT SNA5000A Series Vector Network Analyzers. It enables precise fault location and impedance analysis of cables, PCB traces, connectors, and high-speed interconnects.

The SNA5000-SA option adds Spectrum Analyzer (SA) functionality to SIGLENT SNA5000A Series Vector Network Analyzers, enabling frequency-domain signal analysis without the need for a separate instrument. It supports measurement of harmonics, spurious emissions, channel power, ACPR, and occupied bandwidth.

The SNA5000-SSM option adds full Spectrum Analyzer functionality to SIGLENT SNA5000A Series Vector Network Analyzers, combining frequency-domain and network analysis in one instrument. Analyze spurious signals, harmonics, channel power, ACPR, and occupied bandwidth without the need for a separate spectrum analyzer.

The SNA5000-PV option adds Phase Noise and Frequency Stability measurement capability to SIGLENT SNA5000A Series Vector Network Analyzers. It enables precise analysis of phase noise, jitter, and spectral purity of RF sources and oscillators without a dedicated phase noise analyzer.

The SNA5000-PM option adds Pulse Measurement capability to SIGLENT SNA5000A Series Vector Network Analyzers, enabling accurate RF and microwave testing under pulsed signal conditions. It is ideal for applications where continuous-wave measurements are not suitable.

The SNA5000-MT option adds Material Measurement capability to SIGLENT SNA5000A Series Vector Network Analyzers. It enables accurate characterization of dielectric properties such as permittivity, permeability, and loss tangent of RF and microwave materials.

The Siglent ADP-18 is an adjustable differential (100 Ω) TDR probe for measuring the differential impedance of circuit-board traces, components and wires. A built-in wheel sets the tip spacing from 0 to 6.5 mm, so one probe adapts to uneven pads and traces — no custom fixture needed. With a flat DC–18 GHz response, an SMA connector and better-than-2% repeatability, it delivers fast, consistent time-domain reflectometry measurements.

The Siglent ADP-26 is an adjustable differential (100 Ω) TDR probe for measuring the differential impedance of circuit-board traces, components and wires. A built-in wheel sets the tip spacing from 0 to 6.5 mm, so one probe adapts to uneven pads and traces — no custom fixture needed. With a flat DC–26.5 GHz response, an SMA connector and better-than-2% repeatability, it delivers fast, consistent time-domain reflectometry measurements up to microwave frequencies.

The Siglent ASP-18 is an adjustable single-ended (50 Ω) TDR probe for measuring the impedance of circuit-board traces, components and wires. A built-in wheel sets the tip spacing from 0 to 6.5 mm, so one probe adapts to uneven pads and traces — no custom fixture needed. With a flat DC–18 GHz response, an SMA connector and better-than-2% repeatability, it delivers fast, consistent time-domain reflectometry measurement