SNA5000X-E Series
A 2-port vector network analyzer with exceptional value: 9 kHz to 3 or 6.5 GHz, up to 125 dB dynamic range, a bright touchscreen and time-domain, fixture-removal and automation tools built in.
Overview
The SNA5000X-E series brings full 2-port vector network analysis within reach: a complete S-parameter instrument covering 9 kHz to 3 or 6.5 GHz with up to 125 dB of dynamic range, 1 Hz frequency resolution and an IF bandwidth from 1 Hz to 10 MHz.
Beyond magnitude-and-phase S-parameters it adds differential-parameter, receiver and time-domain (TDR/TDT) analysis, automatic fixture removal for de-embedding, and limit-line pass/fail testing — so a single, affordable analyzer covers design, characterisation and production.
From filter, antenna and cable characterisation to amplifier and active-device testing, the SNA5000X-E handles the everyday RF and microwave measurements that design, education and production teams depend on. Built-in bias-tees feed DC to active parts through the RF port, up to 20,001 sweep points resolve fine detail, and the wide 1 Hz–10 MHz IF bandwidth lets you trade measurement speed against noise. Optional enhanced time-domain (TDR), a spectrum-analyzer mode and automatic fixture removal expand it further, so one compact instrument grows with your work rather than being outgrown by it.
A large capacitive touchscreen, LAN/USB/HDMI connectivity and full SCPI/LabVIEW/IVI remote control round out a compact, automation-ready platform, with an optional high-stability OCXO reference for the most demanding measurements. As the official Siglent distributor for Europe, we hold the SNA5000X-E in EU stock with local warranty, ISO/DKD calibration and expert support.
At a glance
- Type
- 2-port VNA
- Models
- SNA5003X-E · SNA5006X-E
- Max frequency
- 3 / 6.5 GHz
- Dynamic range
- up to 125 dB
- Availability
- EU stock
Key highlights
Up to 6.5 GHz, 2-port
Full forward and reverse S-parameter characterisation from 9 kHz to 3 or 6.5 GHz.
125 dB dynamic range
Up to 125 dB (typ.) dynamic range for accurate measurement of high-isolation and low-loss devices.
1 Hz resolution · IF 1 Hz–10 MHz
1 Hz frequency resolution and an IF bandwidth from 1 Hz to 10 MHz trade speed against noise.
S-param · differential · time-domain
S-parameter, differential-parameter, receiver and time-domain (TDR/TDT) analysis in one instrument.
Built-in bias-tees
Integrated bias-tees simplify testing active devices and components that need a DC bias.
Automation-ready
SCPI, LabVIEW and IVI over USB-TMC, VXI-11, Socket, Telnet and a built-in web server.
Models in the series
Same platform and features — choose by frequency range.
Core capabilities
Full 2-port S-parameters
Measure S11, S21, S12 and S22 with vectored magnitude and phase — the basis for reliable RF component and network characterisation.
Time-domain, TDR & TDT
Transform to the time domain for TDR/TDT, gating and eye/mask analysis — locate impedance discontinuities and characterise interconnects.
Fixture error compensation
Automatic fixture removal and de-embedding move the measurement plane to the device under test, so test-fixture effects are calibrated out.
Automation & production test
Limit lines with global pass/fail, save/recall and full remote control make the SNA5000X-E ready for repeatable production testing.
Bias-tees for active devices
Built-in bias-tees feed DC to amplifiers and other active parts through the RF port — no external tee required.
Modern connectivity
LAN, USB device & host, HDMI output and an optional USB-GPIB, with an optional high-stability OCXO reference.
Features in depth
Advanced analysis functions
Time-domain (TDR/TDT) transforms let you view impedance versus distance, gate out unwanted reflections and isolate individual discontinuities, while eye-diagram simulation and mask testing bring signal-integrity analysis to the same instrument. Together they extend the SNA5000X-E far beyond basic S-parameters — locate faults in cables, connectors and PCB traces, characterise controlled-impedance interconnects and validate high-speed digital links without moving to a separate tool. Every result shares the analyzer's calibration, markers and measurement setup, so the workflow stays fast and consistent from the frequency domain to the time domain.
Fixture error compensation
Real devices rarely present a clean coaxial interface, so the SNA5000X-E includes automatic fixture removal and de-embedding to move the measurement plane onto the device under test. It mathematically removes the effect of cables, adapters and test boards, revealing the true response of SMD components, PCBs and custom fixtures in 1-port, 2-port and multi-port — including differential — configurations. De-embedded results can be exported as Touchstone S2P files, so accurate characterisation no longer depends on building a perfect test fixture or owning an exotic calibration kit.
Automation and production test
For repeatable go/no-go testing, the SNA5000X-E supports limit lines with a single global pass/fail verdict, plus save and recall of complete instrument states for fast changeovers between products. Full remote control over SCPI, LabVIEW and IVI — using USB-TMC, VXI-11, Socket, Telnet and a built-in web server — makes it straightforward to drive from a PC or drop into an existing ATE rack. The result is a network analyzer that moves easily from the R&D bench to the production line without swapping instruments, keeping test setups and results consistent across the whole workflow.
Where it is used
Specifications
Key specs across the SNA5000X-E series (SNA5003X-E / SNA5006X-E).
- Frequency range
- SNA5003X-E: 9 kHz – 3 GHz · SNA5006X-E: 9 kHz – 6.5 GHz
- Test ports
- 2 × N-type, 50 Ω
- Dynamic range
- up to 125 dB (typ.)
- Frequency resolution
- 1 Hz
- IF bandwidth
- 1 Hz – 10 MHz
- Output power
- −40 dBm to +10 dBm, 0.05 dB resolution
- Sweep points
- up to 20,001
- Measurements
- S-parameter · differential-parameter · receiver · time-domain (TDR/TDT)
- Bias-tees
- Built-in
- Calibration
- SOLT, TRL, response, ECal (electronic) & automatic fixture removal
- Display
- Capacitive touchscreen (mouse & keyboard supported)
- Interfaces
- LAN · USB device · USB host · HDMI · USB-GPIB (opt.)
- Rear I/O
- 10 MHz reference in/out · trigger in/out · OCXO option slot
- Remote control
- SCPI · LabVIEW · IVI (USB-TMC / VXI-11 / Socket / Telnet / WebServer)
- Reference
- Internal; optional SNA5000-HPR high-stability OCXO
- Power
- 100–240 VAC · 50 W typ. (90 W max)
Specifications are based on the manufacturer's datasheet and provided for guidance only; they are subject to change without notice. Please confirm any detail before ordering.
In the box
Every SNA5000X-E ships with the standard accessories below.
Optional accessories
Reference sources, calibration kits, cables and demo boards.
High-performance OCXO reference source for tighter frequency stability
Software licences & options
Full 2-port calibration (SOLT, TRL), impedance conversion, fixture simulation and time-domain analysis are standard. These software licences expand the SNA5000X-E further — activated electronically, no hardware to fit. See the full SNA5000 licence page.
Adds a spectrum-analyzer mode — harmonics, spurious, channel power, ACPR and occupied bandwidth on the same instrument.
Transforms S-parameters into the time domain to locate reflections, impedance changes and discontinuities.
Advanced TDR/TDT for fault location and impedance analysis of cables, PCB traces and connectors, with eye & jitter.
Mathematically de-embeds test fixtures to measure SMD, PCB and non-coaxial devices, with Touchstone S2P export.
Resources & downloads
Configure your SNA5000X-E
Tell us your frequency range and whether you need calibration kits, the OCXO reference or GPIB — we'll quote the right SNA5003X-E or SNA5006X-E for your bench or production line.
Frequently asked questions
What is the difference between the SNA5003X-E and SNA5006X-E?
Frequency range: the SNA5003X-E covers 9 kHz to 3 GHz and the SNA5006X-E to 6.5 GHz. Both are 2-port vector network analyzers sharing the same platform, 125 dB dynamic range, touchscreen, measurement modes and accessories.
What can a vector network analyzer measure?
Full 2-port S-parameters (S11, S21, S12, S22) in magnitude and phase, plus differential parameters, receiver measurements and time-domain (TDR/TDT) — for characterising filters, antennas, cables, amplifiers and other RF components.
Does it support fixture de-embedding?
Yes. Automatic fixture removal and de-embedding move the measurement plane onto the device under test, calibrating out cables, adapters and test boards.
Is it suitable for production testing?
Yes. Limit lines with a global pass/fail verdict, save/recall and full SCPI/LXI remote control make the SNA5000X-E straightforward to integrate into an automated production line.
Which calibration kits are available?
SOLT and TRL mechanical kits, electronic calibration (ECal) modules and the KWR42A K-band waveguide kit — plus automatic fixture removal for de-embedding.