Siglent STC6P4W Banana Plug to Triaxial - 4-Wire adapter
Siglent STC6P4W banana-to-triaxial 4-wire (Kelvin) adapter for precision SMU measurements. Supports low-current testing below 1 nA and enables accurate guarded connections to triaxial fixtures and wafer probe stations. Ideal for semiconductor characterization and leakage testing.
Siglent STC6P4W Banana to Triaxial 4-Wire Adapter Professional Kelvin Adapter for Low-Current SMU Measurements
The Siglent STC6P4W is a high-quality banana-to-triaxial 4-wire (Kelvin) adapter designed specifically for precision measurements with the Siglent SMM3000X Series Source Measure Units (SMUs).
It enables accurate low-current and low-resistance measurements while ensuring reliable and stable connections in laboratory and production environments .
Ideal for semiconductor testing, wafer probing, and precision device characterization, the STC6P4W provides a clean and secure interface between standard banana terminals and triaxial test fixtures.
True 4-Wire (Kelvin) Measurement Support
The STC6P4W supports full Kelvin (4-wire) connections, separating force and sense paths to eliminate lead resistance errors. This is essential for:
-
Low-resistance measurements
-
High-accuracy current sourcing
-
Precision voltage sensing
-
Semiconductor and power device testing
Optimized for Low-Current Measurements
Designed for demanding applications, the adapter supports low-current measurements below 1 nA, making it ideal for leakage testing, nano-device research, and high-sensitivity semiconductor characterization .
Seamless Integration with SMU Systems
The STC6P4W is engineered for the Siglent SMM3000X Series SMUs, ensuring correct internal wiring and compatibility with guarded triaxial connections .
It enables easy connection to:
-
Triaxial test fixtures
-
Wafer probe stations
-
Guarded measurement setups
-
Low-noise laboratory environments
Key Features
-
Banana to Triaxial – 4-Wire (Kelvin) adapter
-
Supports ultra-low current measurements (<1 nA)
-
Compatible with precision SMU applications
-
Enables guarded triaxial connections
-
Designed for semiconductor and wafer-level testing
-
Compact, robust mechanical design
Technical Specifications
Maximum Input: DC 250 V / 1 A
Dimensions (L × W × H): 90 mm × 58 mm × 38 mm
Operating Temperature: 0 °C to +50 °C
Storage Temperature: −30 °C to +70 °C
Altitude (Operating): 0 m to 2000 m
Built for Precision Test & Measurement Environments
Whether you are performing:
-
Semiconductor device characterization
-
Leakage current analysis
-
Power transistor validation
-
Nano-device research
-
Wafer probe measurements
the Siglent STC6P4W Kelvin adapter ensures reliable signal integrity and accurate measurement performance.
Its compact footprint makes it ideal for bench setups, automated test racks, and integration into professional R&D and production test systems.