Siglent ADP-18 Adjustable Differential TDR probe DC~18 GHz

€1,035.00

The Siglent ADP-18 adjustable differential probe offers up to 18 GHz bandwidth and adjustable probe spacing from 0–6.5 mm, making it ideal for RF, microwave, and high-speed differential signal measurements. Designed for use with VNAs, oscilloscopes, and RF test equipment, it provides stable and repeatable measurement performance for advanced electronics development.

 

Siglent ADP-18 Adjustable Differential Probe Flexible High-Frequency Differential Probing up to 18 GHz

The Siglent ADP-18 Adjustable Differential Probe is designed for engineers and RF specialists who require accurate differential signal measurements in high-frequency environments. With a bandwidth of DC to 18 GHz, the ADP-18 enables reliable probing of high-speed circuits, microwave components, and transmission lines used in modern communication systems.

A built-in precision adjustment wheel allows the spacing between probe tips to be adjusted from 0 mm to 6.5 mm, making it easy to probe different PCB trace spacings, connectors, or test points without custom fixtures. This feature significantly reduces test setup time and increases measurement efficiency in the lab.

The probe provides a 100 Ω differential impedance, making it ideal for differential transmission line measurements and signal integrity testing. It connects via SMA connectors, ensuring compatibility with common RF test setups including vector network analyzers, RF signal generators, and measurement cables.

The ADP-18 is designed for durability and repeatable measurements. Even after more than 100 continuous measurement cycles, the probe maintains excellent repeatability with ≤2% variation, ensuring stable and reliable test results.

Engineers working on high-speed digital electronics, RF modules, microwave circuits, and impedance characterization will appreciate the flexibility and precision offered by the ADP-18 adjustable probe.

Key Features

  • Bandwidth up to 18 GHz for RF and microwave measurements

  • Adjustable probe spacing (0 – 6.5 mm) for flexible PCB probing

  • 100 Ω differential impedance ideal for differential signal analysis

  • SMA probe connector for easy integration with RF measurement systems

  • Excellent repeatability ≤2% after 100 test cycles

  • Compatible with vector network analyzers, oscilloscopes, and RF test setups

  • Robust mechanical design for repeated laboratory use

  • Suitable for signal integrity and impedance measurements

Typical Applications

  • High-speed digital signal testing

  • Differential transmission line measurements

  • RF and microwave circuit debugging

  • PCB impedance characterization

  • Signal integrity analysis

  • VNA differential measurements

  • RF laboratory testing and development

Specification ADP-18 ADP-26
Probe Spacing 0-6.5 mm Adjustable 0-6.5 mm Adjustable
Probe Connector SMA SMA
Bandwidth 0-18 GHz 0-26.5 GHz
Probe Impedance 100 Ω 100 Ω
Cable Impedance 50 ±0.5 Ω 50 ±0.5 Ω
Cable Connector One end of the SMA is matched with the probe, the other end can choose N or SMA One end of the SMA is matched with the probe, the other end can choose N or SMA
Repeatability and Stability of Probe Test continuously for more than 100 times, R≤2% Test continuously for more than 100 times, R≤2%
Cable Outside Diameter 5 mm 5 mm
Warranty 6 months 6 months
Adjustable Probe Datasheet
PDF – 700,0 KB 4 downloads