Siglent SMM3312X Dual Channel Source Measure Unit (SMU) – Precision 4‑Quadrant Source Meter

The Siglent SMM3312X is a high-performance dual-channel 4-quadrant Source Measure Unit (SMU) designed for precision voltage and current sourcing combined with accurate measurement in one compact bench instrument. With two fully independent channels, the SMM3312X enables advanced semiconductor characterization, parallel device testing, differential measurements, and automated production validation.

Engineered for R&D labs, universities, and industrial test environments, the SMM3312X delivers ultra-low measurement resolution down to 10 fA and 100 nV, while providing powerful output capability up to ±210 V, ±3.03 A DC, and ±10.5 A pulsed current per channel.

With dual-channel output capability up to ±210 V and ±3.03 A DC (±10.5 A pulsed per channel), and resolution down to 10 fA and 100 nV, the SMM3312X is ideal for advanced I-V curve tracing, semiconductor characterization, low-current device analysis, and power device testing. Its fast triggering (10 μs minimum interval), sweep and list modes, pulse generation, and internal data storage make it perfectly suited for demanding R&D laboratories as well as automated production environments where synchronized dual-channel measurements are required.

Designed for maximum flexibility, the SMM3312X supports 2-wire and 4-wire (remote sense) measurements on both channels, enabling accurate testing of low-resistance devices and sensitive components. The 5-inch capacitive touchscreen GUI ensures intuitive operation, while SCPI remote control, USB, LAN, and LXI compatibility allow seamless integration into automated test systems and multi-instrument setups.

Whether you are testing diodes, LEDs, FETs, BJTs, ICs, photovoltaic cells, nano-devices, or precision passive components, the Siglent SMM3312X delivers the performance, versatility, and reliability required for professional dual-channel measurement applications.

High-Precision Pulse Emulation

In pulse mode, the SMM3000X delivers up to ±10.5 A with a 50 μs minimum pulse width, enabling accurate simulation of transient conditions for power devices, including GaN and SiC switching loss testing in semiconductor R&D.

Flexible Custom Sequencing

List Mode enables custom output sequences with a 10 μs minimum interval. Users can program linear, non-linear, arbitrary, or fully customized steps while the instrument sources voltage or current and simultaneously measures and logs data—ideal for transient testing and multi-step stress profiling.

Efficient Programmable Control

Built on an advanced SCPI command set, the SMM3000X series supports remote control via USB and LAN interfaces. Users can operate the instrument through an embedded Web Server for quick setup or implement deep customization via SCPI programming to meet diverse test requirements. Socket communication over TCP/IP further enables seamless network integration for robust remote testing and control.

SMM3312X Key Features

Dual-Channel Precision Source & Measurement in One Bench SMU

The SMM3312X integrates two fully independent 4-quadrant SMU channels, each capable of precision voltage and current sourcing with simultaneous measurement. Both channels can operate independently or in coordinated configurations, enabling flexible test architectures for complex device validation.

Five core functions per channel: voltage sourcing, current sourcing, voltage measurement, current measurement, and resistance measurement.

High resolution down to 10 fA and 100 nV ensures accurate low-level device characterization and leakage current analysis.

Independent 2-wire and 4-wire (remote sense) modes on both channels provide maximum accuracy in low-resistance and high-current applications while minimizing lead and contact resistance errors.

Wide output capability up to ±210 V, ±3.03 A DC, and ±10.5 A pulsed per channel supports both precision low-power devices and demanding power semiconductor testing.

Ideal for synchronized dual-DUT testing, differential measurements, multi-node device characterization, and biasing multiple circuit points simultaneously.

Advanced Pulse, Sweep & List Capabilities

Designed for dynamic device characterization, stress testing, and transient response analysis in modern semiconductor applications.

Supports DC, Pulse, Sweep, and List output modes with independent configuration per channel.

Minimum programmable pulse width: 50 µs, enabling realistic emulation of fast switching conditions.

Arbitrary waveform generation and list scanning with 10 µs minimum interval allow highly customizable test profiles.

High-speed triggering (10 µs minimum interval) ensures accurate timing control for transient and fast switching analysis.

Internal data storage with timestamp capability enables detailed post-test evaluation and statistical analysis.

Perfect for GaN/SiC power devices, semiconductor R&D, photovoltaic testing, and automated stress profiling in production environments.

Automation-Ready Connectivity & Control

Built for seamless integration into modern automated test systems and multi-instrument setups.

Full SCPI remote control support enables advanced automation, scripting, and remote configuration.

Interfaces include USB Device, USB Host, and LAN, with optional USB-GPIB adapter for legacy system compatibility.

Embedded Web Server allows convenient browser-based remote operation and monitoring without additional software.

TCP/IP socket control (port 5025) provides direct integration into custom software platforms and network-based control systems.

LXI compliant with IVI-C and LabVIEW drivers available for streamlined system integration.

Fast command processing and deterministic trigger response ensure reliable synchronization in automated test racks.

Smooth Migration for Existing Test Systems

Optional SCPI “2400 mode” compatible with Keithley 2400 series command structure simplifies migration. Reduces software redevelopment time when upgrading legacy automated test benches. Enables easy expansion from single-channel to dual-channel test configurations without major system redesign.

Safety & lab workflow details customers appreciate

High‑voltage interlock behavior: output is limited to ±42 V when the interlock is open; when shorted, output up to ±210 V is possible (designed to reduce shock risk in HV scenarios).
Digital I/O includes a safety interlock pin enabling output voltage > 42 V.

Model	SMM3312X
Channels	2
Quadrants	4
Max Source Voltage	±210 V
Max DC Current	±3.03 A (per channel)
Max Pulsed Current	±10.5 A (per channel)
Current Resolution	10 fA
Voltage Resolution	100 nV
Max Sampling Rate	100 ksps
Minimum Trigger Interval	10 µs
Minimum Pulse Width	50 µs
Interfaces	USB Device, USB Host, LAN
Remote Control	SCPI (LXI supported)