Siglent SRF5030T 300 kHz to 3 GHz Near-Field Probe Set

Siglent SRF5030T Near Field Probe Set – EMC Pre-Compliance & Debugging up to 3 GHz

The Siglent SRF5030T Near Field Probe Set is a professional EMC troubleshooting solution designed for radiated emissions testing, EMI debugging, and RF interference analysis. The probe set includes magnetic field (H-field) and electric field (E-field) probes, optimized for locating electromagnetic interference sources directly on PCBs, cables, connectors, and electronic assemblies.

Operating in the frequency range from 300 kHz to 3 GHz, the SRF5030T probes allow engineers to quickly identify and isolate problem areas during EMC pre-compliance testing. By scanning close to the radiation source, emissions can be detected long before formal compliance testing, reducing development time and costly redesigns .

The probe set includes multiple probe sizes to balance spatial resolution and sensitivity, making it suitable for both coarse scanning and pinpoint analysis. Shielded probe construction minimizes pickup of common-mode noise and ensures stable, repeatable measurements, even in dense circuit layouts .

The SRF5030T is typically used in combination with a spectrum analyzer and is ideal for EMC diagnostics, RF immunity investigations, and non-contact measurement of RF building blocks such as oscillators and modulators .

Key Features of the Siglent SRF5030T

• Near field probe set for EMC and EMI troubleshooting

• Frequency range: 300 kHz to 3 GHz

• Includes H-field and E-field probes

• Multiple probe sizes for optimal spatial resolution

• Shielded design to reduce common-mode noise pickup

• Slim probes for access between tightly spaced components

• SMB connector with supplied adapter cables

• Ideal for EMC pre-compliance, RF debugging, and repair diagnostics
  

The Siglent SRF5030T Near Field Probe Set is an essential tool for electronics engineers who need a fast, reliable, and cost-effective way to locate EMI issues before formal certification testing.